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Keithley 4200A-SCS Parameter Analyzer

Keithley 4200A-SCS Parameter Analyzer

The Keithley 4200A SCS parameter analyzer is a precision instrument for testing and characterizing semiconductor devices. It combines current-voltage (I-V), capacitance-voltage (C-V), and pulsed I-V measurement functions in one system. This makes it useful for a wide range of research and development tasks, including materials testing, device modeling, reliability studies, and failure analysis.
 
The system comes with built-in software that includes hundreds of pre-written test routines you can modify to suit your specific needs. It also offers real-time graphing and automatic extraction of key parameters so you can analyze data as you collect it. The software also includes guided test creation and measurement tips to help ensure accurate results.

  • All-in-One Characterization System: This system combines current-voltage, capacitance-voltage, and pulsed I-V testing in one platform for complete semiconductor device analysis.

  • Accurate Low-Level Capacitance Measurement: Enables sensitive and low-noise capacitance characterization, suitable for advanced materials and device structures.

  • Seamless Switching Between Test Modes: This feature allows automated transitions between I-V and C-V measurements without manual re-cabling or repositioning, saving time and reducing error.

  • Stable Low Current Performance: This device is designed for high-precision low current measurements in challenging setups, such as those with long cables or high capacitance.

  • Real-Time Analysis and Visualization: Offers immediate feedback with live data plotting and automated extraction of key parameters during measurements.

  • Ready-to-Use Test Libraries: Includes a wide range of editable application tests, enabling faster setup and consistent testing across different devices and teams.

  • Flexible Integration with Probers and Environment Controllers: Works with various manual and semi-automated wafer probers and temperature control systems for extended testing environments.

  • Modular and Scalable Design: Easily add or swap modules to match evolving test requirements without interrupting lab operations.

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