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FCT Test System

FCT Test System

Overview: Functional test system to validate electrical and functional performance of the product

Project Description: This project focuses on developing an advanced Functional Circuit Testing (FCT) system that performs comprehensive validation of electronic products by simulating real-time operating conditions. It verifies the performance of key components such as microcontrollers, power circuits, communication interfaces, and analog/digital sections, ensuring proper interaction between hardware and firmware. The system combines customized hardware fixtures and automated test software to execute test sequences, capture results, and generate detailed reports with high accuracy and repeatability. By emulating real signals and loads, it detects functional issues beyond ICT capability, reduces manual effort, and ensures the product is fully ready for reliable field operation.

Key Features:

  1. Automated functional testing with high accuracy
  2. Customizable test sequences based on product requirements
  3. Real-time data acquisition and monitoring
  4. User-friendly GUI interface
  5. Support for multiple communication protocols (UART, USB, CAN, Ethernet)
  6. Fast testing cycle with high throughput
  7. Error detection and diagnostic reporting
  8. Modular and scalable design

Test Coverage:

  1. End-to-end Functional Testing (FCT) including boot-up, I/O, relays, LEDs, and switches validation
  2. Power validation covering voltage rails, current measurement, and sequencing checks
  3. Communication protocol testing (UART, I2C, SPI, CAN, LIN, Ethernet, USB)
  4. Analog & digital signal validation including ADC/DAC, clock signals, and logic levels
  5. Sensor simulation and actuator response verification
  6. Firmware validation (flashing, version check, integrity testing)
  7. Safety checks including grounding, protection, and insulation
  8. End-of-Line testing with barcode traceability, pass/fail results, reporting, and MES integration
  9. Advanced diagnostics with fault detection, error analysis, and basic stress testing
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